Yes it is possible the presence of defects from XRD

Yes, Sir you can detect defects from XRD analysis, you just have to use the Williamson and Smallman method to find out the dislocation density in your material.

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Yes, Sir. You can find the dislocation density in your sample when you know the crystal size of your material. It is the reciprocal of the square of the crystal size.

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Yes. You can use XRD refinement technology to determine the occupancy rates of different types of atoms and prove the existence of point defects. However, this method is not very accurate for the occupancy rate of light atoms.

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