Here is a little problem I came across yesterday in a discussion that I thought interesting enough to share with the RG community.

Assume you have measured a thin layer of an organic material on a metallic substrate. The layer is 1 micron thick and the peak of interest in a transflection measurement had a peak value of absorbance A (=-log10(R/R0)) = 0.178. Now I ask you to repeat the measurement with a layer of the same material that is 20 microns thick (actually, for simplicity assume that this is an average thickness so that interference effects do not occur). Are you able to measure the interesting peak without problems or will you see nonlinearities and noise effects since your detector can manage absorbances only up to 3?

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