If we doped metal oxide to semiconducting material in different ratios then the property of the resultant material will be increased.But in some lower ratios when we go through the elemental composition the coated material is not present in the required percentage. then how we can conclude?
In general, EDAX is not the best way to examine concentration-dependent properties of "Doped Coatings", foe two main reasons:
1. The EDX sensittivity is limited by the emission process cross-section, that favours core levels of heavy atoms, and by average atomic concentration to be revealed, which has to be larger than unity percentage range.
2. The EDX probed volume depends on the incident electron energy, which is in the few keV range or more. The probing depth id in the micron range (say 0.5-2 depending on material characteristics and primary electron energy. However, the probed volume has a "pesr-like" shape, that is most of the probed material is deep below the surface.
The combined effect of the above limitations is that a doping level below 1% at. (or even in the few %at.) present only in a surface coating much thinner than the probing depth of EDX will be nearly undetectable, or "reliably" detectable.
Of course, if neither of the above conditions involves your specific case, other more peculiar reasons might hold, and more info would be needed to formulate possible hypotheses.
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