I have taken an SEM cross-sectional image while sample was placed on a stage tilted at 45o. Will it reveal true thickness or do I need to consider angle while obtaining the thickness? The working distance was 4.6mm and image was taken in InLens mode.
Of course you have to correct for angle. Simple geometry. Unfortunately previous replies to your question were wrong.
Generally SEM itself reveals actual diameter of any structure but actually you didn't mention what is your product.
For nano materials my statement highly applicable.
I don't know what kind of samples you work with, but it should give a fairly accurate measurement even if inclined at any angle. The scale bars are relative to the magnification and not direct measurement of the objects. So if you accurately measure your sample with the scale bar, it should be quite accurate on the sample thickness, or size.
Of course you have to correct for angle. Simple geometry. Unfortunately previous replies to your question were wrong.
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