Dear all,
I am bothered by when should I use RS or XRD in the solar cell structural analysis. In other words, the advantage and disadvantage of RS and XRD. I have seen many papers use RS or XRD to analyze the structure of the crystalline Si in the solar cell. However, I am not clear how to use those diagram to analyze the structure.
Thanks in advance
Both techniques are complementary. XRD give you the crystal structure, lattice parameters and qualitative crystallinity, whereas RS give you the frequency modes which is a fingerprint of each compound. If you have acess to both techniques, better for your analysis.
Best regards,
Pedro
Dear Chenjin
I agree witih Dr.Callardo answer, also you can read the following references which is very useful for knew more about XRD technique and Raman spectroscopy:
Tove E., "Reactive sputtering and composition measurements of precursors for Cu2ZnSnS4 thin film solar cells", Licentiate thesis, Uppsala universitet, pp.9 June 2013.
Jessica E., "Experimental Study of Cu2ZnSn(Se,S)4 thin films for solar cell applications",Diplomarbeit thesis, Institutionen for teknikvetenskaper, department of engineering sciences, Examensarbete, 30hp,TVE 11019, June 2011.
Rajeshmon V. G., " Prospects of sprayed CZTS thin film solar cells from the perspective of material characterization and device performance", Thesis of PhD, Department of Physics, Cochin University of Science and Technology, Cochin - 682 022, Kerala, India, November, 2013.
With best regards
Dear Chenjin,
Firstly, you are suggested to check the crystal structure by your XRD data. You can analyze your data by just simply comparing the literature or you can use XRD data cards. After that, you can use the Raman spectra to confirm the crystal structure by means of the location of vibration modes. For Raman spectra, you may find the possible vibration modes from the library of your measurement device or in literature.
All the best.
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