Elemental composition is measured rather by X-ray fluorescence. That gives the molecular formula only if the material is "pure", i.e. consists of a single substance. It requires calibration, i.e. not absolute.
Elemental composition is measured rather by X-ray fluorescence. That gives the molecular formula only if the material is "pure", i.e. consists of a single substance. It requires calibration, i.e. not absolute.
If layer thickness is less than x-ray penetration and diffractogram belongs to layer then XRD will identify the formula once matched with a known database compound. However, preferential orientation of layers and thin film should always be kept in mind before matching compounds.
XRF elemental analysis will also help if in doubt.
I agree with Towe, Banhegyi and Mansour suggestion. However, you can Refer to ICDD files of your know compounds. One can refer to X-ray density , and mass attenuation formule.
the problem that i have is my compound is not known as common.
and iccd file does not give any results or gives to many results.
i want to make decision by density.
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