Hi,

I need an appropriate model for HCI. In your "compact modeling and Simulation of Circuit

Reliability for 65-nm CMOS Technology", you present a formula for vth degradation due to HCI.

But I have a problem with the constant parameters presented in table 2.

when I use this formula with the presented constants, vth degradation after 10 years is in nv scale. Also when I calculate the final dimension of this formula, which should be v because of vth degradation, the final dimension is v.nm^2.(sec)^0.45.

would you please help me how I can find the mistake?

I'm looking forward to receiving an email from you.

Best Regards,

Farzaneh Nakhaee

Article Compact Modeling and Simulation of Circuit Reliability for 6...

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