Hi,
I need an appropriate model for HCI. In your "compact modeling and Simulation of Circuit
Reliability for 65-nm CMOS Technology", you present a formula for vth degradation due to HCI.
But I have a problem with the constant parameters presented in table 2.
when I use this formula with the presented constants, vth degradation after 10 years is in nv scale. Also when I calculate the final dimension of this formula, which should be v because of vth degradation, the final dimension is v.nm^2.(sec)^0.45.
would you please help me how I can find the mistake?
I'm looking forward to receiving an email from you.
Best Regards,
Farzaneh Nakhaee
Article Compact Modeling and Simulation of Circuit Reliability for 6...