Conventionally XRR, X-Ray Reflectivity, measurements have been conducted using a point or line source but always using the 0D point/scintillation/proportional type detector without spatial resolution. The 0D mode is the most commonly and successfully employed methodology.

The advent of 2D detectors and real time imaging today have created endless possibilities. Is anyone in this erudite RG community aware of implementation of XRR in the topographic mode to date? Please share your expertise and knowledge in this very interesting field of XRR with numerous practical applications.

Any helpful literature references would embellish us all. Thanks in advance for sharing!

https://www.researchgate.net/post/Would_anyone_have_a_clue_as_to_the_origin_of_unexpected_spots_in_the_real_time_2D_XRR_signal_from_thin_film_samples_on_substrates_Yuneda_Spots

https://www.youtube.com/watch?v=7My4_17mACo&index=49&list=PL7032E2DAF1F3941F

http://www.northeastern.edu/nanomagnetism/downloads/Basic%20Principles%20of%20X-ray%20Reflectivity%20in%20Thin%20Films%20-%20Felix%20Jimenez-Villacorta%20[Compatibility%20Mode].pdf

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