X-ray reflectivity (XRR) is a technique abundantly used and vetted, for determining film thicknesses and "flatness" of thin film samples on substrates, over the past century. We have implemented this method in real time using a 2D detector to examine
The 2D XRR signal was acquired using AXIS25 2D imaging system with spatial resolution of 27.7um, 12.5 fps, 12 Bit dynamic range. The XRR signal using ω-2ϴ (coupled) and/or ω (decoupled) scans, shows some interesting persistent "spots" on either side of the "main beam". I'm unable to ascertain the origin of these "unexpected spots" that appear in both cases. We've used the Bruker D8 for the NIST 2000 sample, ω-2ϴ (coupled), and a Panalytical X'Pert for the Pt. thin film, ω (decoupled), with nearly identical optics and beam conditioners. The incident beam was monochromated to KAlpha 1 only while the KAlpha 2 component was attenuated!
Please share your experience and knowledge in XRR to help explain the origin of these "unexpected spots". The angular range (0-0.2o, between the main beam and the total internal reflection angle) is too small for these to be from some diffraction phenomenon such as "slit scattering", isn't it?
Your helpful suggestions will be deeply appreciated!
RAW VIDEO DATA XRR Pt Thin Film Sample: https://www.youtube.com/watch?v=I8lvqjQY7as
https://www.flickr.com/photos/85210325@N04/19057561360/in/dateposted-public/
https://www.flickr.com/photos/85210325@N04/19239243452/
https://www.flickr.com/photos/85210325@N04/19248953711/in/dateposted-public/
http://www.northeastern.edu/nanomagnetism/downloads/Basic%20Principles%20of%20X-ray%20Reflectivity%20in%20Thin%20Films%20-%20Felix%20Jimenez-Villacorta%20[Compatibility%20Mode].pdf
http://www.bornagainproject.org/documentation/welcome