Usually, (001) peak of COF corresponding to layer stacking is widely observed in the XRD patterns.
However, in simulation, (001) and (101) peaks are observed together very sharply.
As with simulation, can (001) and (101) peaks be observed sharply in the experiment?
Dear Son Yl , when performing an experiment you will have at least peak widths according to the instrumental broadening of the XRD set-up.
For details about (and contributions to) the instrumental broadening please see around page 22 of:
http://prism.mit.edu/XRAY/oldsite/CrystalSizeAnalysis.pdf
or around page 14 of:
http://prism.mit.edu/xray/documents/5a%20Estimating%20Crystallite%20Size%20Using%20XRD.pdf
Best regards
G.M.
The peak width used during simulation should taken into account the intrumental contribution together with that of the sample (as in the experiments). So, if you do not know these values and if you used approximate values, the width of the simulated diffraction peaks could be very different with respect to the experimental ones
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