currently I have experiment about deposition carbon on the glass substrate. I have problem to solve from my experiment. can you help me? how must I do to determine the thickness of my thin film that I test using FTIR? can I using this formula?
b=1/2n N/(v1-v2)?
where b is film thickness, n is refractive index of sample, N is number of fringes within a given spectral region, v1 and v2 are start and end point in the spectrum in cm-1.
carbon film probably absorb some IR as you have to know, in what form the carbon bonded together...i mean C=C, C-C or anything else...better use alpha-step or some other simpler methods to deal with it...
One can determine the film thickness from the interference fringes. To do this
1. You must select the region of the spectrum where there is no sample absorption.
2. One must have a smooth film with very little scattering. Roughness increases diffuse scattering from the sample and may effect the interference pattern contributing to errors in your analysis.
I don't have an experience with Focused Ion Beam method + SEM (FIB-SEM), but I think it could be good for such determinations (you can get 3D images showing the internal texture + chemical data ot once); also, the Grazing Indicence Diffraction is used for textures of samples, but I'm not sure if its capable of giving the info you need.
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