I have two sets of XPS spectra, one from a lab-scale X-ray apparatus, and another from a synchrotron source. As they are, both sets of data make sense (i.e. show expected trends) in and of themselves after quantification, charge correction, and normalisation, but are way off in their intensities when overlayed in a common file in CasaXPS.

The two different instruments used different pass energies to collect the respective data. Is there a way I can normalise the combined data set so that it can be analysed, and are there any other corrections that need to be made to account for differences between the two instruments?

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