BiFeO3 thin film grown on LaAlO3(001) substrate shows 'R' like phase near the film-substrate interface which further goes to 'T' like phase with increasing thickness. Out-of-plane lattice parameter increases from 'R' like phase to 'T' like phase. Is it possible to same kind of structural transition if BiFeO3 film is grown on SrTiO3(001) substrate?
I am trying to grow films and I can do HRXRD for phase confirmation. If I get a proper phase then I will go for RSM measurements. Getting access for TEM is a bit difficult for me. That also I will try.
I was going through the existing papers and most of the time I see, only a small range of XRD scan is shown for BFO/STO system which covers only the 'R' like phase. In the paper http://scitation.aip.org/content/aip/journal/apl/88/24/10.1063/1.2213347, I feel there is a peak very close to 35degree in Fig.2 which has not been discussed in the paper. This is creating confusion for phase determination of my films.
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