I have BFO thin film with different thickness measurement, But XRD with normalization is showing shift towards higher angle?
Dear Shahnaz,
Please detail the question. If any graphical presentation, please attach it.
Hi...
How did you prepared BFO. What is the particle/grain size of your BFO. How thickness is your BFO. You should give clear question. How did you normalized the XRD graphs.
Dear Shahnaz kossar Rajput
Displacement of XRD peaks is due to changing the lattice parameter. I do not know the method you used to prepare the layers. You should check what changes you made to create each layer thus you can identify the reason for changing the lattice parameter.
You might be interested to interrelate, check, if the (different) thickness of your BFO films has any correlation with a (fluctuating, oscillating) different[1] BFO (shifting in the) Molarity[2] ?
1. Preferred orientation showed oscillatory behavior between (122) and (315) plane because of the shifting between mixed and pure bismuth iron oxide phases[2].
2. Molarity dependent oscillatory structural and magnetic behavior of phase pure BiFeO3 thin films: Sol–gel approach https://www.sciencedirect.com/science/article/pii/S0272884218321187
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