In the XRD experimental analysis of polycrystalline TiN films, are TiN (111) and TiN (222) different crystal planes? Or are they the result of different diffraction levels of the same crystal plane? If they are the same crystal plane, what factors are related to the changes in the intensities of the (111) and (222) peaks?
As we know the different crystal planes are denoted by Miller Indices i.e (h,k,l) values. So different hkl values represent different planes. So the mentioned two planes are not same. From the Bragg's law of diffraction we know, nλ = 2d(hkl) sin θ, and d(hkl)=a/√(h^2+k^2+l^2), So when the wavelength is fixed then d and sin θ is variable. So different planes will represent different 2theta values. It may possible that the planes are equivalent by the symmetry of the lattice.
The intensity of the peaks depend on the number of same planse present into your material . The diffraction intensity will increase as the number of same planes are increased.
Biplab Mondal Thank you very much, sir. I couldn't agree with you more. However, according Bragg's law of diffraction, namely, nλ = 2d(hkl) sin θ, though the wavelength is fixed, the d and sin θ can also changed by the variation of n. Is it possible that the (222) and (111) are the same plane but with different n?
n is the order of the diffraction, like first order, second order......
If you want to represent n by different levels, that is not correct.
As far I know different miller indices always represent different planes, yes (111) and (222) planes may symmetrically same by transformation. The two planes will give two different peak position.
And from your point of view I can say,
Let us say this FCC crystal
So first order diffraction peak is corresponding to (111)
The second order diffraction is (222)
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