As far as I know, NO. On the other hand I have to say, that even very experienced guys who are working for many years very successful  in the XRD business havn't seen more than 200-400 different phases in their life. In other words, you really don't need a database if you roughly know which phases might appear in your system. Then you can check them manually by calculating the diffractogram based on the crystal structure data and compare them with the experimental diffraction pattern. They are anyway more reliable than many data in databases where the intensities are questionable. JCPDS files are commercial and therefore protected by licences. Single CIF files are available at open databases (e.g. COD) or can be extracted for single phases from databases like ICSD or ICDD. I am not sure whether this is legal but people do this from time to time, also here at Researchgate.    

I have used the software "Match" for my XRD analysis on some metals.. It is quite accurate for the most common metals like Cu, Ni and Fe. However, it has a lot of limitations on oxides and other metal compounds. I suggest reading related literatures with XRD studies and compare them with your results. Yes, it is time consuming and requires persistence but with the right type of journal and proper correspondence, you'll be able to identify those peaks.

Here found a additional tool, find the attachment. Deleted research item The research item mentioned here has been deleted

I think like Kathy Lois Amores rightly pointed out, the sure bet is to search literature for previous studies and compare the peak positions with yours.

Here is a method to compare the XRD data with JCPDS data, it may helpful to you, https://www.researchgate.net/publication/339363196_Match_XRD_data_with_JCPDS-_A_method_2020/stats

Here is a method to compare the XRD data with JCPDS data, it may helpful to you, https://www.researchgate.net/publication/339363196_Match_XRD_data_with_JCPDS-_A_method_2020/stats