Good morning
I want to determinate the oxidation state of a element onto a Surface after of electropolymerization in a substrate. In addition to X Ray Photoelectronic Microscopy (XPS) Which other technique can I to use to determinate that oxidation state?
Thanks
I'll think you'll find this has been answered a number of times on Research Gate. For example: https://www.researchgate.net/post/Is_there_any_technique_available_to_know_the_oxidation_state_of_metal_ion_other_than_XPS
Hi Alberto,
Alan is in principle right with his link of a recent RG question on oxidation states.
But in your case you have to be very surface sensitive. Therefore the NEXAFS/XANES technique mentioned in the link is only suitable in combination with grazing incidence x-ray spectroscopy close to the critical angle of total reflection.
If your 'type' of element is only found at the surface (but nothing elsewhere) you may use NEXAFS/XANES in the fluorescence or total photo-electron yield mode, preferably also in grazing incidence geometry (but you can here stay a bit above the critical angle of total reflection).
But in all these cases mentioned here the experimental expenditure is high.
It does not matter. The main thing is, that your element is not C, N, O, F etc. as commonly beeing part of the polymer molecules. In the case of NEAFS/XANES spectroscopy the element is adressed by its K-edge energy of its x-ray attenuation spectrum.
But for very thin mass coverage ( mono-layer or less) it is advised to use a Synchrotron as x-ray source in order to have enough countrate in your measured spectrum.
Remark: for NEXAFS/XANES please google. There is a lot of Information there. I will not repeat these things here, because they are often discussed here in RG.
https://en.wikipedia.org/wiki/X-ray_absorption_near_edge_structure
https://www.researchgate.net/post/what_is_the_difference_between_XANES_and_EXAFS
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