Hi,
I have images of coating structures deposited at various process parameters. As there is no availability of HRTEM to differentiate the coating growth, I am looking for a mathematical/analytical method to analyze the coating growth. Can anyone recommend be a possible method to analyze a coating structure with a grain size of approx. 30-40 nm using a mathematical/analytical function. SEM images of two coatings are attached in the link below.
Hi,I'd offer you AFM technique:
Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.The AFM has three major abilities: force measurement, imaging, and manipulation.The atomic force microscope (AFM) was developed to overcome a basic drawback with STM - it can only image conducting or semiconducting surfaces. The AFM has the advantage of imaging almost any type of surface, including polymers, ceramics, composites, glass, and biological samples. - See more at: http://www.nanoscience.com/technology/afm-technology/#sthash.lduiAQLj.dpuf
AFM measurements have been already performed for the study. Looking for a tool which use images as a basis for the analysis
Dear Muhammad
Refer to the following;
Farzia Karim, Tanujjal Bora, Mayur B. Chaudhari, Khaled Habib, Waleed S. Mohammed, and Joydeep Dutta,” Measurement of aluminum oxide film by Fabry–Pe´rot interferometry and scanning electron Microscopy” Journal of Saudi Chemical Society, (2016) in press, http://dx.doi.org/10.1016/j.jscs.2016.02.001.
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