Recently I am doing my undergrad thesis on CuO thin film. I am facing problem in XRD characterisation as the peak in 32 degree becomes abnormally high whereas it should be a minor peak. What could be the possible reasons behind it?
Sovendo Talapatra You can correct the typos in your question (XrD for XRD; 32 degrees not 32 degree) by use of the downward arrow on the right of the question. Please post your full diffractogram. Thin films sometimes require longer acquisition times because of the weaker intensity. Possible reasons are:
Orientation of the sample with respect to the beam showing preferred crystal planes different from a bulk sample
Substrate 'bleedthrough'. On what substrate was the CuO deposited?
Amorphous content
How do the positions of all the peaks compare to what is expected from the JCPDS card for CuO?
The appearance of an abnormal height in the XRD peak at 32 degrees for copper oxide (CuO) could indicate the presence of a secondary phase or impurity in the sample. Furthermore, energy-dispersive X-ray spectroscopy may be needed to confirm the identity of the impurity and determine its impact on the properties of the sample.