What could be the reason for this situation in the AFM image? Is what is marked a DEFECT? and why. This is an image (AFM) for ZnO prepared by Sputtering method with -200 V as bias voltage and after annealing at 450 °C.
It could be. In order to check whether it actually is that or a tip artifact. Have you recorded amplitude error or phase channels? If there are spikes in the place of the potential defect, it's a tip issue, if not, it's most likely a defect.
Dear Jürgen Weippert,
I have the following information related to the image , which I hope is what you are looking for.
SetPoint : 60.000
SetPointPhysUnit : V
FeedBackModus : ncAFM R
Bias : 0.000
BiasPhysUnit : mV
Ki : 3000
Kp : 3000
XScanRange : 5.000
YScanRange : 5.000
XPhysUnit : µm
YPhysUnit : µm
Speed : 1.000 ; lines/sec
Angle : 5156.6
xPixel : 512
yPixel : 512
yCenter : 0.000
xCenter : 0.000
dzdx : dz/dx=0.000°
dzdy : dz/dy=0.000°
LockInFreq : 333989.00
LockInFreqPhysUnit : Hz
LockInAmpl : 0.300
LockInAmplPhysUnit : V
FileDescBegin
FileName : 100TopoFwd.int
Caption : TopoFwd
Scale : -2.02000001081615E-0006
PhysUnit : nm
FileDescEnd
FileDescBegin
FileName : 100TopoBwd.int
Caption : TopoBwd
Scale : -2.02000001081615E-0006
PhysUnit : nm
FileDescEnd
FileDescBegin
FileName : 100AmplitudeFwd.int
Caption : AmplitudeFwd
Scale : -3.46500006465078E-0009
PhysUnit : V
FileDescEnd
FileDescBegin
FileName : 100AmplitudeBwd.int
Caption : AmplitudeBwd
Scale : -3.46500006465078E-0009
PhysUnit : V
FileDescEnd
FileDescBegin
FileName : 100PhaseFwd.int
Caption : PhaseFwd
Scale : -5.59999980032444E-0003
PhysUnit : °
FileDescEnd
FileDescBegin
FileName : 100PhaseBwd.int
Caption : PhaseBwd
Scale : -5.59999980032444E-0003
PhysUnit : °
FileDescEnd
Looking forward to hearing from you.
OK, so you worked in non-contact mode. Then these channels don't exist, I had assumed this would be tapping mode.
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