16 November 2014 13 6K Report

 

i. How does one adjust for this type of sample displacement error (see figure in link below) with a conventional diffractometer measurement using the ubiquitous 0D Geiger counter (point counter)?

https://www.flickr.com/photos/85210325@N04/15511271935/

ii. What is the typical procedure for this "fine tuning" of the diffractometer?

iii. How long does something like this take?

iv. How does one ensure that the "flat" sample surface is collinear (or at least coplanar) with the diffractometer z-axis (rocking axis)?

I could empathize with those that are real finicky about alignment based on some of our contemporary experiences. I'll share a few :-)

Really appreciate you folks sharing your experiences in this regard. It will benefit the entire RG community interested in NDE XRD for in situ materials' Nano structure characterization.

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