Hello,

The diffractogram (enclosed) was measured on ZnO thin films (incident fixed angle 0.3 deg), by asymmetrical reflection measurement. Why the doublet for each reflection appear? This is not K alpha 2.

The films were deposited on a seeded ZnO film. Is it umbrella effect?

Can exist two sets of reflections, one from seeded ZnO (spherical particles) and the other from the ZnO nanorods (with strongly distorted unit cell parameters)?

Thanks!

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