If the X-ray diffraction (XRD) peak position and width are the same, but the intensity of the peak is different, it could indicate a difference in the amount of crystallinity of the material being analyzed.

The intensity of an XRD peak is related to the number of atoms in the crystal that are capable of scattering X-rays. Therefore, a higher peak intensity indicates a higher number of atoms in the crystal, which could indicate a higher degree of crystallinity or larger crystal size. On the other hand, a lower peak intensity could suggest a lower degree of crystallinity or smaller crystal size.

However, it's important to note that there could be other factors that affect peak intensity, such as sample preparation, instrument settings, and data analysis techniques. Therefore, it's necessary to consider all factors and perform additional analyses to accurately interpret XRD data.

Dear Mohammed Hossan Shahid Shohrawardy ,

in addition to the above answer, I would like to add a special aspect of 'sample preparation' as already mentioned by Raghd Muhi Al-Deen Jassim , which show up as the 'preferred orientation' artifacts, which are caused by non sufficient homogenous distribution of orientation*) of the crystallites in the 4pi space. In non-powder sample the areal distribution of preferred orientation is called 'texture'.

For non-powder samples a spinning sample stage will help to reduce the preferred orientation artifacts.

You may share what type of sample(s) you dealt with...

*) please carefully mix the powder

Best regards

G.M.

Dear Mohammed Hossan Shahid Shohrawardy as already mentioned by Gerhard Martens Raghd Muhi Al-Deen Jassim intensity may be effected by crystallinity of your sample. If you are seeing change of intensity in some peaks that may be due to preferred orientation but if change of intensity is there in all peak that may be due to some temperature effect. Therefore please specify about temperature. And second reason may be the instrument parameter like power, steptime.

In X-ray diffraction (XRD), the peak position and width of a diffraction peak are related to the crystal structure and the size of the crystallites in the sample. The intensity of the diffraction peak, on the other hand, is related to the number of atoms in the crystal that contribute to the scattering of X-rays, as well as the quality of the diffraction pattern.

If the peak position and width are the same for two diffraction peaks, but the intensities are different, it can indicate that the two peaks are originating from different crystallographic planes, or that the sample contains different amounts of the crystalline phase responsible for each peak.

For example, if a diffraction pattern has two peaks with the same position and width, but one peak is much stronger than the other, it could mean that the sample contains more of the crystalline phase responsible for the strong peak. Alternatively, it could mean that the crystallographic plane responsible for the strong peak has a higher atomic packing factor and thus scatters X-rays more strongly than the plane responsible for the weaker peak.

In some cases, the difference in intensity may also be due to experimental factors such as sample preparation, instrument settings, or measurement time. It is important to carefully analyze the XRD pattern and consider all possible factors that may affect the intensity of the diffraction peaks before drawing conclusions about the sample.

For this, I would recommend the latest preprint article at link DOI: 10.13140/RG.2.2.27720.65287/3 or at link https://www.researchgate.net/publication/352830671