Anil Sonawane The (002) peak of ZnO, the most intense peak in the XRD pattern, corresponds to the diffraction of X-rays from the c-axis of the wurtzite crystal structure. When ZnO is doped with other elements, the intensity of the (002) peak can change and shift due to several factors. These include lattice parameter changes, crystal defects, and preferential orientation. An increase in the intensity of the (002) peak indicates that the doped ZnO crystals are well-aligned with their c-axes perpendicular to the substrate, which can be beneficial for applications like photovoltaics and gas sensing. Conversely, a decrease in the intensity can indicate that the doped ZnO crystals are not well-aligned or have a significant number of crystal defects. The shift of the (002) peak to the left indicates that the lattice parameter of the ZnO crystal has increased, which can be caused by doping with an element with a larger atomic radius than zinc. For example, doping with aluminum (Al) increases the intensity and shifts the (002) peak to the left, as Al has a larger atomic radius than Zn and is preferentially incorporated into the c-planes of the ZnO crystal. On the other side, doping with magnesium (Mg) decreases the intensity of the (002) peak but does not significantly shift it, as Mg has a smaller atomic radius than Zn and is not preferentially incorporated into the c-planes of the ZnO crystal.
The specific effects of doping on the XRD pattern of ZnO depend on the type of dopant and the doping concentration.
Anil Sonawane This is due to the crystal structure and orientation of ZnO, which has a hexagonal wurtzite structure with two lattice parameters: a and c. The hexagonal plane is perpendicular to the c-axis, which is the (002) peak. Other peaks, such as (100), (101), (102), and so on, correspond to the a-axis, which is parallel to the hexagonal plane. The doping process may affect the c-axis more than the a-axis, depending on the type and concentration of the dopant. The a-axis is less affected by the doping process.