Hello,

I have been reading through literature regarding the exfoliation of VDW materials to produce 2D materials. and what I have noticed is that for some materials XRD diffractograms showed a decrease in peak intensity after exfoliation, which can be explained by decrease in thickness. However, for some materials the corresponding XRD diffractograms showed no significant decrease in peak intensity. Is there any explanation for this trend? and would it be better always to investigate the successful exfoliation through Atomic Force Microscopy and TEM?

thank you.

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