Hi everyone,
The attached file compares the XRD patterns for the oxide and oxide-CNT coatings on aluminum substrate with relatively similar thicknesses (~ 30 µm). As it can be seen, all the XRD peaks slightly shifted towards lower 2θ values (around 0.3-0.6 degree for every peak) with CNT incorporating. The coatings were fabricated by plasma electrolytic oxidation. However, I am not sure about the reason for shifting the XRD peaks to lower 2θ values by incorporating MWCNTs. What is the cause of the shifting in this case? CNT doping ro sample displacement error or zero error?
"What is the cause of the shifting in this case? CNT doping ro sample displacement error or zero error?" It just displacement and zero error. But to make sure, perform a refinement.
Dear Maykel,
Thank you for your reply. Could you please provide me more details about the refinement process?
It's quite complicated. You cud look for Rietveld tutorial or check links below:
http://profex.doebelin.org/
http://maud.radiographema.eu/
https://www.ill.eu/sites/fullprof/
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