Elementary analysis - HCNSO + (XRF or ICP-MS for other elements).

regards,

G

Depends on the sample and elements you're interested in, how many elements and what detection limit is acceptable. X-ray techniques are good for heavier elements - XPS for surfaces, EDX/XRF for bulk. For light elements, other techniques are better, such as AES. SIMS is great for low detection limits.

XRF is a good all-round technique for ppm to %’s of most elements. AAS or ICP is good for much lower concentrations - ppb or ppt...

Whst materials are you trying to quantify?

Tell us about your task first. Too many techniques, too many requirements.

I'm trying to determine Silica-Alimina ratio of Kaolinite and Feldsparthic raw materials for dental porcelain body compositions.

I think XRF is the best method for your task. You do not need good spatial resolution and you do not need to analyze trace elements.

There is NO doubt that XRF ( WDX ) is more accurate and reliable than

(EDX, and PIXE), however, EDX, and PIXE are faster and cost effective.

Waooh...

Thank you Dr Vladimir Dusevich and all that have taken time to answer my question.

EDX/XRF

I love using XRF for similar purpose. My regards.

Excellent contributions by everyone. I really enjoy the conversation.

Thank you Dr Dusevich.