There are two primary ways for XRD analysis. One is for single crystals another is for powder samples.
Thin films can have unidirectional growth for careful sputtering or CVD, PLD, ALD etc techniques. On the other hand, chemical methods like sol-gel, spin coating or dip coating of dispersed nanoparticles etc can produce thin films having radom crystallite or growth-direction. Accordingly, the XRD instrument has to be chosen and thereby analysis (e.g., Rietveld analysis) could be done.