there many analyze to determine the exact size of the synthesized nanoparticles which is a more accurate TEM or XRD data analysis
Mohamed I. Aly
Accuracy is always defined by comparison against a known certified standard. XRD and TEM are measuring different parameters of your material as indicated by Vincenzo Amendola . They are complementary, not competitive, techniques. Crystallite and particle size are not the same. A 2-D representation of a 3-D structure may also involve interpretation or assumption of shape. All size techniques tend to provide equivalent diameters for irregular particles. Understand what your techniques measure and report.
TEM will give you the geometrical size of your material. XRD gives the mass-weighted average size of the crystalline domains present in your sample. Frequently multiple crystalline domains are assembled together in a larger structure with shape measurable by TEM.
Mohamed I. Aly
Accuracy is always defined by comparison against a known certified standard. XRD and TEM are measuring different parameters of your material as indicated by Vincenzo Amendola . They are complementary, not competitive, techniques. Crystallite and particle size are not the same. A 2-D representation of a 3-D structure may also involve interpretation or assumption of shape. All size techniques tend to provide equivalent diameters for irregular particles. Understand what your techniques measure and report.
Dear Mohamed I. Aly ;
TEM is an accurate method to measure nanoparticle size, while XRD characterizes the phases formed and its crystalization structures.
TEM is more useful where the size of nanomaterial is concerned
Hello Mohamed I. Aly
The two measurements are different.
In the XRD analysis, you are measuring the crystallite size, with a poorly estimation using the Scherrer's equation (The K factor in the Scherrer's equation is a form factor, where K ~ 1 you have a perfectly round sphere particle, which we know that this is not true in most of the cases). One way to improve this analysis is to use the Rietveld refinement method, which has LX and LY parameters that are intrinsically connected with the size and Strain(%) in the crystallite.
In TEM you are measuring a 2-D particle size, which can be considered the physical length of the particle, not the crystallite size (a particle normally is formed by several crystallites). In this method, using TEM, it is crucial that you measure several particles in different regions and perform statistical analysis.
Regards,
Gustavo.
XRD is measuring the crystalline size alone.
TEM are measuring the 2D particle size.
Particles are formed as several crystals
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