Based on a short review, I found SEM-EDX (particle-based) and ED-XRF, ICP-MS, ICP-OES, ICP-AES, AAS,... (bulk). What method should be preferred and why? Filter material consists of teflon-coated borosilicate filters and Nuclepore track-etched polycarbonate membranes (Whatman).

I'm interested in the following elements: Cu, Cr, V, Mn, Fe, Ni, Zn, Pb, Ca, Na, Mg, Al, As

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