Which bulk and particle-based methodology should I apply for elemental analysis of leaf- and filter-deposited PM?

Based on a short review, I found SEM-EDX (particle-based) and ED-XRF, ICP-MS, ICP-OES, ICP-AES, AAS,... (bulk). What method should be preferred and why? Filter material consists of teflon-coated...

05 October 2016 1,038 3 View