I am analyzing the data obtained from powder diffraction of a MoS2 thin film. I want to assign phases to the peaks obtained in my pattern. The software that I'm currently using is PowderX but it does not have the option to overlay 2 patterns on one another. I am looking for a software which has the option of overlaying 2 patterns and/or the option of profile fitting.
Dear Shrey Jain;
You can use "Bruker DIFFRAC. EVA" which provides tools for the quick analysis of one- and two-dimensional diffraction data. it covers broad analytical spectrum functions. you can; evaluate basic scan, analysis the peak's details, identify and quantify phases, to the determination of crystallinity and crystallite size, more details in the attached site;
https://www.bruker.com/content/bruker/int/en/products-and-solutions/diffractometers-and-scattering-systems/x-ray-diffractometers/diffrac-suite-software/diffrac-eva.html
Dear Shrey,
If you are looking for an open source solution, as Ali has suggested, the Fullprof suite is very powerful but has a learning curve. Most of the commercial software usually purchased from the equipment manufacturers, will work fine as well but they tend to be very expensive and in addition to it's price you may be required to pay an additional price for the ICDD database. You can use the COD database (open database) which in my opinion gives pretty reasonable results. Match! from Crystal impact while being commercial, is very reasonably priced and can simplify working with Fullprof via it's GUI. You can use it with COD as well and you may find it suitable for you needs. In my opinion it does not fall short compared to the other commercial software, is regularly updated and supported.
Good luck
Fullprof suite can be used. Highly recommended and very useful
Alternatively, Origin is a very powerful option. It might be that you have a free license at your university. Can recommend this also for other raw data handling, plotting, data analyses etc..
https://www.originlab.com/
We found that origin is easy, powerful and at the end it can provide high quality graphs
The best software I normally used when I when I want to compare my XRD results is Origin. You can easily make an overlay of your XRD data as much as possible. I hope my answer will be of help.
I would suggest MAUD http://maud.radiographema.eu/ for a full scale XRD analysis. Compared to Fullprof it is a kind of a more user friendly (simplified would be a wrong word). It is free and open source, though not GPL licence.
Only for profile fitting I would suggest to use something simpler at first, like fityk https://fityk.nieto.pl/ MAUD and Fullprof are powerful programs for u.a. Rietveld analysis. No point to mess with them "only" for profile fitting. By "XRD analysis", what do you exactly mean? What do you exactly want to do?
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