I am investigating some off-stoichiometric delafossite structure by TEM. I am observing some missing atomic lines (10- 20 atoms missing). This happens for many grains (hence not an isolated case) but not for all samples. Therefore I would like to know if this defect is characteristic for the sample or is possible to appears during sample preparation. During this preparation process I am using a FIB based on Galium. My question is then: does somebody already observed this kind of defect appearing during an ion bombarding?
The most popular artifacts which can be induced by FIB milling are amorphization and Ga ion implantation. However, the appearing of a particular artifact strongly depends from the preparation protocol and vary for different materials. What the protocol did you use?
Moreover, you mentioned that the sample was off-stoichiometric delafossite. Is it possible that some atoms are missing because of off-stoichiometry? Which atoms are missing?
Very interesting image! Such defect(s) are conceivable, depending on the direction of ion beam impact in relation to orientation of grains, but I've never seen it or heard of anything similar. I'd suggest posting a question and link to this image on US Microscopy Society listserver (www.microscopy.com): quite a few people who've been doing UHR-TEM since the dawn of time and FIB sample prep for the above are on there.
Thank you for answers. The missing atoms are copper. By XPS we determined a huge Cu deficiency but we didnt expect such arrangement, There are all over the sample and at random orientation sut we might exclude influence of ion beam dirrection, However we obtained this only for samples deposited in specific conditions (but not for the others) and these defects are dissapearing after an annealing. I would like to know how they are dissapearing as the weird stoichiometry remains.
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