i have characterised the nanostructured film of noble metal nanoparticles using atomic force mcrocopy, and i am unable to analyse it on the basis of the roughness data obtained?
The best way is having a control sample and do the comparison between them.
Article Pulse Electrochemical Deposition and Photo-electrochemical C...
What do you mean by "unable to analyze it on the basis of roughness value"? Roughness is a relative thing and also it depends on the scale you are looking at and the probe you are using, the experimental conditions used for deposition and the substrate on which you are depositing (in some cases).
What is that you want to analyze or study? Do you want to study the effect of surface roughness on experimental conditions?
Actually i want to know, what valuable information can be obtained from the roughness data obtained along with AFM scanning.
Think of an application and see if your sample roughness suits the application instead of doing it other way round.
Dear Shubhangi,
Will I help you to analyze the data obtained from the AFM morphological/ topological characterization/ study ?
My research paper related to amplitude, statistical and spatial parameters (roughness parameters) (rms value, skewness, Kurtosis moment, Redundness and entropy) are some sort of, will able to understand/help, what your research studies and applications require.
http://www.sciencedirect.com/science/article/pii/S0968432816301512
Best of luck.
The increase of surface roughness in optical materials and semiconductors is good parametr in photovoltaic devicces increase the harvest of light by this materials
in addition, you can use AFM data to calculate r.m.s value, Std value
There were also studies in the past where the effect of ITO roughness on OLED performance was studied by AFM.
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