XRD is the elastic scattering of X-rays and si no absorption of energy occurs but a directional scattering the output is therefore number of X-ray counts with diffraction angle.
EDX is energy dispersive X=ray spectroscopy. This an an absorption of X-ray by electron in atoms which emits and X-ray at a different energy when electron returns to the ground state. The output is the number of excited X=ry with energy, usually eV.
XRD is a technique in which diffraction of X rays with the crystal lattice are observed. X rays which are diffracted at Bragg's angle are diffracted and combine to give a pattern which shows about the planes in the crystal. X ray diffractogram is resulted and the position and intensity of the peaks are observed. In short XRD is used to determine crystal structure and degree of crystallanity of a material.
While EDX is an absorption technique as explained by Miroslav. Here we observe the absorption of xrays in the material and then emission of other x rays which are resulted due to interaction of incident x rays with the electrons. The emitted rays have a specific energy depending on the elements present in the material and are analyzed by spectrometer. By this method elemental composition of the material is determined.
Briefly: with XRD it is possible to identify products made of elements; with EDX it is possible to identify chemical elements. Chemical elements are all possible to identify because EDX is an absorption spectra of elements and XRD identify only non amorphous products
They are fundamentally different characterization methods.
Basically XRD attempts to characterize the material by analyzing the crystal structure, and comparing it against a database of known structures.
Pros: Based on the instrument and the sample, it can provide you with loads of information about the material, such as phase, grain size, texture, %crystallinty , and stress.
Cons: It's toothless against amorphous materials. You need to have a general idea about the possible composition of the material. Approaching an absolutely unknown sample with XRD alone may be confusing.
EDS is an elemental analysis technique. Here you stimulate your sample by electrons or high-energy photons, and detect the spectrum of outgoing photons.
Pros: This is an elemental analysis technique. Compared to XRD it requires very little expertise in materials science, and less initial information about the sample. It is usually combined with scanning electron microscopy, which makes it a versatile tool for acquiring a composition map of the sample, or getting area-specific elemental analysis.
Cons: It suffers from numerous artifacts, which any good operator should know about. Some are general artifacts, and some are specific of the machine in use. It has a poor spectral resolution, compared to its cousin, WDS. It also suffers from a poor spatial resolution.
XRD gives information on which compounds or phase (e.g. TiNi3, Ti2Ni) do exist. EDX provides information on the relative amount of elements exist in a sample (e.g. 25% Ti, 75% Ni). In many cases, you will need to use both methods in order to confirm which compounds are there. They are complementing each other.
Energy Dispersive X-ray Analysis (EDX) can be used to investigate the properties and compositions of a broad range of sample types. EDX is used for chemical identification of elements and their concentration.
X-Ray Diffraction (XRD) is used for Phase identification. It is used to identify spatial arrangements of atoms in crystalline phases.
In EDX, electrons knock out electrons from atoms, producing X-rays of characteristic wavelength. These X-Rays are then detected to identify the element from which they were produced. In XRD, X-rays of known wavelength are used to probe the structure of the material, using the lattice as a diffraction grating.
To perform an EDX you need an electron source. For XRD you need an X-ray source.
If you are looking for chemical composition, concentration gradients, or solute segregation, use EDX.
If you are looking for phase distribution, lattice strain fields or stored defect content, use XRD.
EDX is used for chemical identification of elements and their concentration of materials , XRD is used to identify spatial arrangements of atoms in crystalline phases of materials.
If you are looking for elemental analysis, concentration gradients, or solute segregation, use EDX.
If you are looking for phase distribution, lattice strain fields or stored defect content, use XRD.