There are only a few broad reflection peaks in the spectrum. The main reflections of WO3 films are at 2 theta = 23.1, 28.7, 33.5 and 41.7 degree (Cu-radiation).
There are different ways - you could use a software like FullProf or something similar input the basic parameters (from literature of possible) and use the software to refine them. You can also use programs like Lazy Pulverix.
I would recommend using an internal standard (SiO2 or Si) to have a substance you can compare your diffraction pattern with.
If you are doing XRD on thin films there might be a chance that you get some sort of prefered orientation. What hkl-values do the reflections you observe have? You need all hkl's to calculate the lattice parameters in an orthorhombic cell.
Also there is information in the book " X-ray diffraction" by B. E. Warren, Chap. 5 in how to analyze orthorhombic powder patterns
Oliver Janka, thanks for your very helpfull answer. with best regards, U. Krebs
even with fullprof, you have 2 ways to perform that :
a full Rietveld refinement if the crystal structure is known (and this is the case for WO3 according to wikipedia...)
or just a Lebail fit, also called "profile matching", in this case you don't need a structural model
of course, the diffractometer must be correctly calibrated
you may have informations and download the softwares here :
http://www.ccp14.ac.uk/mirror/mirror.htm
including fullprof and gsas
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