Hans-Ulrich Krebs

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Questions related from Hans-Ulrich Krebs

Can anyone help us with a program to simultaneously compare/fit x-ray diffraction patterns of multilayers at low (XRR) as well as high (XRD) angles?

It would be most interesting for us to compare and fit the X-ray results of periodic multilayers at low (x-ray reflectivity) and high (x-ray diffraction, including satellites) angles...

11 November 2015 7,760 4 View

Can anyone help with a program for FFT (fast fourier transformation) for the determination of G(r)?

We have measured the x-ray diffractograms of amorphous oxide thin films. Now we are looking for a fast fourier transformation program to easily determine the radial distribution function G(r) of...

10 October 2014 4,611 9 View

What is the best way to calculate the exact orthorhombic lattice parameters from diffraction data (2 theta values)?

There are only a few broad reflection peaks in the spectrum. The main reflections of WO3 films are at 2 theta = 23.1, 28.7, 33.5 and 41.7 degree (Cu-radiation).

03 March 2014 542 7 View