I am trying to find out the ratio of alpha to beta grains in a bulk (non-powdered) sample of silicon nitride as well as their size distribution. What technique is best for determining this information? Would XRD work?
Thanks
Adam
Dear Adam Baggott,
XRD would be the fastest and realible technique to quantify the alpha to beta ratio in silicon nitride.
Pls find in the following papers, it is possible to have some understanding regarding the quantification. Ne
1.Structural characterization of cubic silicon nitride
2.http://jcpr.kbs-lab.co.kr/file/JCPR_vol.10_2009/JCPR10-3/Vol.10,No.3,pp.296~300_2009.pdf
I hope that helps.
Regards
Engin
Dear
Baggot
XRD is widely used. You simply can take a SEM image of your samples to see the size distribution by any image analysis software like ImageJ.
Thank You.
Dear Adam Baggott,
XRD would be the best technique to detect the alpha to beta ratio in silicon nitride. You can also you Electron back‐scatter diffraction (EBSD) technique, also known as Orientation imaging microscopy (OIM) or Back‐scatter Kikuchi diffraction pattern (BKDP) method, is useful to determine the local crystal structure and orientation of single or polycrystals
For more information and details to know how can you find out the ratio of alpha to beta grains in sample of silicon nitride as well as their size distribution, Please go to articles 1 to 3 (XRD) and 4 (EBSD or OIM or BKDP), they will strongly help you in your study:
1.http://www.iiss.sanu.ac.rs/download/vol40_3/vol40_3_05.pdf
2.https://pdfs.semanticscholar.org/6361/1eab02a0b138556eb1ae5639e146e6b8243b.pdf
3.https://nvlpubs.nist.gov/nistpubs/Legacy/SP/nistspecialpublication876.pdf
4.Article EBSD: A powerful microstructure analysis technique in the fi...
With Best Wishes,
Samir G. Pandya
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