I have synthesized a thin ceramic coating with a thickness range about 8-10 microns. I need to have an elemental analyse of this coating. Can I use XRF for this purpose? is there any other method?
You have to be very careful using xrf on such thick layers even if you only look for a qualitative composition. Depending on your setup and the main constituents of the ceramic you will have limited information depth for lighter elements. So eg Al2O3, you cannot detect at all or at least not from the whole layer thickness. This can have severe influence on the derived composition.