First record XRD pattern in full range for you sample and match some standard pattern to know preinformation about crystal structure. Then go for Rietveld refinement using some standard software e.g. FullProf. From the out file obtained after refinement you can get intensity for each (hkl) planes.
Just do Rietveld refinement of your XRD pattern, maybe with two or three phases (depends where Sn is going and what substituting).
If you have true dopation levels (
Just Do WIDE X-ray diffraction pattern on the present sample, try to match the XRD patters with known NiZn ferrite and Sn crystal structures peaks. Sometimes we may not see the peaks because, Its depends on the percentage (%) of the dopents. Try to see the old references about these type of compositions.
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