I am working on RRAM devices in which Pulsed I-V characterization is improtant for SET/RESET Switching and Endurance of the device. I have two 4200 SMU, two 4210 HPSMU, two 4225 PMU with RPMs (Sufficient Facility) and currently using the conventional setup (picture attached) given by the Keithley manual and library of the 4200SCS. But, i think, its not showing the reliable and appropriate results which might be due to some wrong setup. Please suggest the proper connections or any literature regarding this.