Dear all,
I deposited CrN film using different conditions. I observed a strong texturation along (111) direction (already reported in numerous publication), but a large variation of the films density (RBS measurement) and the bandgap, which is quiet unexpected (in a extreme case: a epitaxial film should normaly present similar bandgap and density than a polycristalline film, isn't it?)
Does anyone have paper on the relation between the RBS density and/or the texturation coefficient and/or the bandgap of film?
Thank you,
Regards,
Emile HAYE
You question sounds strange to me.
1. What type of substrate have you used?
2. The thin film density should be determined by at least 2 independent methods. The easiest one is to weight the substrates before and after the growth and precisely determined thin film thickness.
3. If you have epitaxial stoichiometric layers the density should be constant and the band gap values should be similar.
You should make difference between a polycrystalline textured film and epitaxially grown layer.
Dear Daniela,
Thank you for your answers. The substrate is glass. Unfortunately, the films are too thin to get an accurate methods of weight measurement. There is no epitaxy at all, just a preferential orientation along 111 direction, but the film are polycristalline.
My question are:
1. Is there relation between the density of a film and its texturation?
2. Is the bandgap of a film similar for a textured or polycristalline film?
3. Is the bandgap dependent on the texturation level?
If you have any paper related to this subject, could you give me some reference?
Thank you and best regards ,
Emile HAYE
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