I have submitted a paper in a journal and the reviewers reply to me with this. Can anyone guide me on this how to solve it
Thanks in advance
Figure 4: (i) the image presented in panel (a) shows clear signs of measurements artifacts; (ii) Pale grey does not reproduce well; (iii) the labels presented on the axes of the images are not well aligned in the tick marks .; (iv) Verify the y- and x-axis scales.
First picture (x=0) is wrong picture :) As You can see there are two images witch offset. I have never seen ALL reproductable structures as shown on picture (x=0). Repeat measurement, change probe (cm to tm or tm to cm)) and You will see diference.
(x=0,04) look blurry, repeat mesurement with new probe (sharp one).
IMHO only (x=0,02) is ok :).
What was the reason to measure nanoparticles (i gues its nano size) with 10x10 um scale??? 2x2um would be better. What was the reason to make diferent Z scales - are you sure if you would like to make some comparison of pictures, Z scale should be different? Looks (x=0.06) is smaller than othes.
Usually I making marker, white box with bar showing distance - eg. 1 um. It solve some EXPECTED questions. REGARDS!
It seems to be artifact in Figure (a).It so-called "double tip" occurs when the probe tip has more than one point in contact with the sample. This most often occurs when the tip breaks and leaves a jagged point. Therefore, you can change the cantilever and then repeat the measurement.
Buket Akın , Muhammad Shahbaz Anwar and Janusz Rebis thanks a lot for your precious time
I will try to repeat the measurement with a new tip
Thanks for all of you
Dear Muhammad Danish Ali! The new measurement has to help with the images. Use 2 microns field as the maximum. And for the rest of the comment -- Photoshop will help you, because probably you will be not able to change the pictures outlook in the microscope program.
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