Hi,

I'm doing a process that uses a thin layer of SU-8 as an insulator. I was getting short circuits so I made a simple metal-SU8-metal structure (Figure 1 ). My SU-8 tests included SU8-2000.5, 2001, and 2002 with thickness varying from 0.7 um to 4.5 um. I also tested two different e-beam evaporated thin films, gold and chromium, around 100 nm for each layer.

All of them seemed to be shorted. I have attached some pictures showing the layers under the microscope (Figure 2-5). I spotted some potential pinholes or bubbles ONLY in SU-8 layers on top of the bottom electrode. The SU-8 layer alone on Si and Au/Cr layers alone seem rather clean. I wonder why this is happening and if you have any suggestions?

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