No use of SEM, by methods such as IV testing
And how to observe the sample using TEM?
There are several methods to characterize nanoporous films made of polyethylene terephthalate (PET) without the use of scanning electron microscopy (SEM). One method is by performing electrical characterization through IV testing. This involves measuring the current-voltage (IV) curves of the nanoporous film using a source-measure unit (SMU). By analyzing the IV curves, one can extract information about the pore size distribution, pore connectivity, and surface area of the nanoporous film.
Another method for characterizing PET nanoporous films is through gas adsorption measurements such as nitrogen or carbon dioxide. These measurements can provide information about the surface area, pore size distribution, and pore volume of the film.
Transmission electron microscopy (TEM) is a high-resolution imaging technique that can be used to observe the microstructure of materials at the nanoscale. To prepare a sample for TEM, a thin slice or a small piece of the nanoporous film is first cut using a focused ion beam or a microtome. The sample is then placed onto a TEM grid and inserted into the TEM instrument. TEM images are formed by passing a beam of electrons through the sample, which interacts with the material and produces an image on a detector. TEM can provide detailed information about the pore morphology, pore size distribution, and crystal structure of the PET nanoporous film. However, it requires expensive equipment and expertise to perform the analysis.
The classical use of the SEM would not bring anything, but the use of its electron beam allows to solve all material problems. If you want to learn how to do it, contact me.The classical use of the SEM would not bring anything, but the use of its electron beam allows to solve all material problems. If you want to learn how to do it, contact me.
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