As title, except that commonly used microscopy like AFM, SEM, TEM... etc, what kind of characterization method is suitable for the determination of coverage of self-assembled monolayer? We know that XPS or ATR(IR) might be a good way to address this issue, but how about molecules are in the high aspect ratio region ? any suggestion is welcome, thanks!
Things like contact angle can give you broad stroke ideas about coverage and homogeneity. But there is rarely a good substitute for microscopy.
Also I wouldn't ignore raman mapping. Depending on your material.
Maybe you should consider Surface Enhance RAMAN Spectroscopy (SERS), because RAMAN is not sensitive to mono-layer in many cases, such as nitrogen layer on top of diamond bulk.
What are dimensions of the sample?
Some Brewster angle microscopes may work also with films on solid substrates.it will give picture of surface coverage in low resolution (hundreds of micrometers) for a large area.
If your substrate is conductive and relatively flat (+/- 20 nm, like Au-coated glass slide), than SEM will work fine. Area depends on the scanner. Typically up to 120um.
- Badges
- Science topic
- Similar topics
- Chemistry
- Biochemistry
- Biochemical Techniques
- Blotting Techniques
- Immunoblotting
- Dyes