I am having an internal struggle with this. I have samples which are cubic and yield high quality diffraction patterns out to 120 °2Θ using a Cu-based Lab XRD instrument with good resolution. When analyzing synchrotron data I see the same trend in lattice parameters between samples but with smaller magnitudes. Which lattice parameters are a closer representation of the actual lattice parameter?

With sync you have inherently higher resolution, and more observed peaks, but you have a more limited range of °2Θ coverage and the wavelength actually used may not be accurately defined.

With Lab XRD we can collect a full range of °2Θ with a known wavelength.

So educate me; sync or lab XRD for lattice parameters?

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