I made CoFeB thin film on PMMA.
The film thickness is from 100 nm to 10 nm.
To measure magnetic properties, an M-H loop according to the angle was obtained using a VSM. However, the graph by angle was almost the same. The measurement direction is In-plane. That means the samples don’t have In-plane magnetic anisotropy. Is it right? And I’m curious that in general amorphous CFB without any buffer layers, treatments doesn’t have In-plane anisotropy or not.
Dear Yungeun Ha ,
Due to the strong demagnetizing field in the perpendicular direction, the magnetization stays in-plane. So, properly speaking, as there is no preferential in-plane direction, you shoud say that your material has isotropic in-plane anisotropy.
Dear Prof. Jose,
Is it right to call such anisotropy as of XY type (no Sz component in spin space)?
Thank you
Referring to the question on whether absence of in-plane anisotropy is generic for amorphous films:
In-plane anisotropies may have other reasons than crystal ansisotropy, which indeed should be zero for amorphous films. Many substrate materials provide residual aligned steps on the surface caused by a miscut, which may or may not be on purpose. In this case, stray-field anisotropy contributes to the in-plane anisotropy. A second source can be field-alignment of atom pairs even in the amorphous state, if a magnetic field is present during film deposition.
XY type: The XY model is a theoretical model describing magnetic phase transitions for systems with a two-dimensional order parameter. Because the Sz component is only suppressed and not zero in any case, one has to examine a particular experiment and physical question that should be answered, whether the system can be called XY type. For example the system will not behave like a XY type system, if an external perpendicular field is applied and the Sz component can actually be measured.
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