TEM is direct evidence. Are any other methods available? how to interpret?
Try in SPS spectra. Since it can detect sub-surface atoms it may helpful to you. SPS is available in CECERI karikudi.
best
UV-Vis spectroscopy can be use as an alternative technique to probe the core-shell structure from the spectral features of the particles.
Try and use FE-SEM with FIB option, you will need to etch the core sheell structure (possibly few layers) and then investigate in Same SEM so they do not oxidise.
Atom probe tomography is a very powerful technique to study the Core/shell nanostructures.
APT is a very powerful technique to study the Core/shell nanostructures.
Hi, depending on what parameter of the core/shells you want to measure, a straightforward approach would be to use XPS, which will give chemistry and thickness of of the shell.
Article VAMAS Inter-Laboratory Study on Measuring the Thickness and ...
https://doi.org/10.1002/sia.5923
Do elemental mapping in FESEM. First, do the core and then core@shell at very high resolution so that you can able to see a few particles. That will help.
Remember don't forget to dilute your sample, otherwise, you will not be able to get the highly dispersed sample on Stubb.
You can go through the following article. They have listed quite a few techniques in their paper.
https://pubs.rsc.org/en/content/articlelanding/2018/nr/c8nr02278j#!divAbstract
Dear Everybody!
I think currently single particle ICP-MS is one of the most efficient independent measurement method which able to available to confirm the predicted core/shell nanostructure.
Article Determination of the structure and composition of Au-Ag bime...
A core-shell structure can also be characterized using Small-angle X-Ray Scattering (SAXS).
Hi and Hello,
It depends upon parameter both used SAXS and APT technique used.
G. Selva Manohari, The Atomic force microscopy and ICP-MS technique will be effective to confirm the Core/shell of nanostructured materials.
You found report in following doi
https://doi.org/10.1039/C7NR04770C
XPS is perfect to know the elements of compounds and the chemical binding of each element as well. Narrow scan XPS can specifically be used to measure the intrinsic (core) and extrinsic (shell) domain of your materials.
Hi,
Depends on the thickness and porosity (if yes or no) of the shell..
I will recomand XRD and Focus Ion Beam..
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