The line profile analysis for SFE calculation, based on calculation of peak shift, extrinsic and intrinsic stacking fault probability has been done for powder samples.
Can this be done for bulk sample (in form if thin foil)?
"X Ray Line Profile Analysis use to Calculate Stacking Fault Energy", very interested in this line of thought. Please post references when convenient.
"Aluminium alloys valid for foil type sample", would invariably include significant effects due to "preferred orientation" that would reduce the effectiveness of conventional equatorial scan line profile analyses.
"Preferred Orientation" would inherently skew any convention equatorial scan diffractogram, typically used in "X Ray Line Profile Analysis".
How do the stacking fault affect the Bragg profile? Below the FWHM? Sort of like this? https://www.flickr.com/photos/85210325@N04/24151817359/in/datetaken/
I'm seeking some reference literature on this matter as well.
Foils are normally produced by rolling, and they usually are not nanostructured materials. Stacking faults have a well know relation to Bragg peaks and can be modeled using structural refinement approaches.
"Stacking faults have a well know relation to Bragg peaks and can be modeled using structural refinement approaches." I'm looking to learn this better. Got any good references to educate me with?